Psychotic experiences are associated with greater impairment among students in higher education with depression and anxiety in the United States.


Por: Hans Oh, Du J, Smith L and Koyanagi A

Publicada: 1 ene 2024 Ahead of Print: 12 oct 2023
Resumen:
BACKGROUND: Psychotic experiences are associated with depression and anxiety, but emerging research suggests that psychotic experiences are also associated with impairment within psychopathology. METHODS: We analyzed a subsample from the Healthy Minds Study (2020-2021; N?=?91,435) and used multivariable logistic regression to examine the associations between psychotic experiences and impairment resulting from depression and anxiety, adjusting for age, gender, and race/ethnicity. RESULTS: Around one-in-five students with depression or anxiety impairment reported 12-month psychotic experiences. Psychotic experiences were associated with greater odds of depression impairment and anxiety impairment, adjusting for age, gender, race/ethnicity. Odds ratios varied depending on the type of psychotic experience and the outcomes. CONCLUSION: Psychotic experiences are associated with greater odds of impairment resulting from depression and anxiety. In clinical practice, psychotic experiences may serve as a useful marker of assessing impairment resulting from psychopathology.

Filiaciones:
Hans Oh:
 Suzanne Dworak Peck School of Social Work, University of Southern California, Los Angeles, CA, USA

Du J:
 Southern Methodist University, USA

Smith L:
 Centre for Health, Performance, and Wellbeing, Anglia Ruskin University, Cambridge, United Kingdom

Koyanagi A:
 Research and Development Unit, Parc Sanitari Sant Joan de Déu, Centro de Investigación Biomédica en Red de Salud Mental (CIBERSAM), ICREA, Pg. Lluis Companys 23, 08010 Barcelona, Spain
ISSN: 01650327





JOURNAL OF AFFECTIVE DISORDERS
Editorial
ELSEVIER, RADARWEG 29, 1043 NX AMSTERDAM, NETHERLANDS, Países Bajos
Tipo de documento: Article
Volumen: 344 Número:
Páginas: 325-328
WOS Id: 001101489000001
ID de PubMed: 37838267

FULL TEXT

imagen Published Version https://www.elsevier.com/about/policies/open-access-licenses

MÉTRICAS